Title :
GA-based system for critical points detection
Author :
Liatsis, P. ; Ooi, C. ; Goulermas, J.Y.
Author_Institution :
Sch. of Eng. & Math. Sci., City Univ., London
Abstract :
A GA-based algorithm for detection of dominant points in closed contours is presented. The proposed scheme aims to simultaneously optimise the number of detected critical points and the approximation error. A new error metric is proposed which takes into account information from the Chamfer image. The performance of the system is shown to be robust to changes in the position, orientation and size of the contour as well as the length of the chromosome
Keywords :
critical points; genetic algorithms; image processing; Chamfer image; approximation error; closed contours; critical points detection; genetic algorithm;
Journal_Title :
Electronics Letters
