• DocumentCode
    795611
  • Title

    UV-induced index change in hydrogen-free germane-silicate waveguides

  • Author

    Jarvis, R.A. ; Love, J.D. ; Durandet, A. ; Conway, G.D. ; Boswell, R.W.

  • Author_Institution
    Res. Sch. of Phys. Sci. & Eng., Australian Nat. Univ., Canberra, ACT, Australia
  • Volume
    32
  • Issue
    6
  • fYear
    1996
  • fDate
    3/14/1996 12:00:00 AM
  • Firstpage
    550
  • Lastpage
    552
  • Abstract
    The authors present the first report of an induced refractive index change in germane-silicate glass containing no detectable levels of hydrogen. The single layer waveguide was deposited on a silicon wafer by helicon activated reactive evaporation (HARE), and following exposure to 193 nm UV from an excimer laser, an absolute decrease of 0.006 in refractive index was measured. The dopant level of germanium is estimated to be -15% (mol)
  • Keywords
    germanate glasses; optical glass; optical waveguides; refractive index; vacuum deposited coatings; 193 nm; GeO2-SiO2; UV exposure; dopant level; excimer laser; helicon activated reactive evaporation; hydrogen-free germane-silicate glass; refractive index; silicon wafer; single layer waveguide;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19960314
  • Filename
    490466