DocumentCode :
795851
Title :
The Effects of Operating Temperature on the Behaviour of Semiconductor Detectors
Author :
Martini, M. ; McMath, T.A. ; Fowler, I.L.
Author_Institution :
Physics Division, Chalk River Nuclear Laboratories, Atomic Energy of Canada Limited, Chalk River, Ontario
Volume :
17
Issue :
3
fYear :
1970
fDate :
6/1/1970 12:00:00 AM
Firstpage :
139
Lastpage :
148
Abstract :
The similarity in behaviour shown by lithium-drifted germanium and silicon detectors in recent detailed studies of their spectrometer performance over a wide temperature range1-3 suggested a comparison with the effects of temperature on the operation of other types of semiconductor detector. In this paper, a summary of the data published in the literature on temperature effects in compensated (p-i-n) and non-compensated (p-n) detectors is presented. Conditions for optimum spectrometer performance and limits to operating temperature are discussed, from experimental results and theoretical considerations.
Keywords :
Detectors; Electron mobility; Germanium; Leakage current; Rivers; Silicon; Spectroscopy; Temperature dependence; Temperature distribution; Temperature sensors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1970.4325686
Filename :
4325686
Link To Document :
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