DocumentCode
795851
Title
The Effects of Operating Temperature on the Behaviour of Semiconductor Detectors
Author
Martini, M. ; McMath, T.A. ; Fowler, I.L.
Author_Institution
Physics Division, Chalk River Nuclear Laboratories, Atomic Energy of Canada Limited, Chalk River, Ontario
Volume
17
Issue
3
fYear
1970
fDate
6/1/1970 12:00:00 AM
Firstpage
139
Lastpage
148
Abstract
The similarity in behaviour shown by lithium-drifted germanium and silicon detectors in recent detailed studies of their spectrometer performance over a wide temperature range1-3 suggested a comparison with the effects of temperature on the operation of other types of semiconductor detector. In this paper, a summary of the data published in the literature on temperature effects in compensated (p-i-n) and non-compensated (p-n) detectors is presented. Conditions for optimum spectrometer performance and limits to operating temperature are discussed, from experimental results and theoretical considerations.
Keywords
Detectors; Electron mobility; Germanium; Leakage current; Rivers; Silicon; Spectroscopy; Temperature dependence; Temperature distribution; Temperature sensors;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1970.4325686
Filename
4325686
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