• DocumentCode
    795851
  • Title

    The Effects of Operating Temperature on the Behaviour of Semiconductor Detectors

  • Author

    Martini, M. ; McMath, T.A. ; Fowler, I.L.

  • Author_Institution
    Physics Division, Chalk River Nuclear Laboratories, Atomic Energy of Canada Limited, Chalk River, Ontario
  • Volume
    17
  • Issue
    3
  • fYear
    1970
  • fDate
    6/1/1970 12:00:00 AM
  • Firstpage
    139
  • Lastpage
    148
  • Abstract
    The similarity in behaviour shown by lithium-drifted germanium and silicon detectors in recent detailed studies of their spectrometer performance over a wide temperature range1-3 suggested a comparison with the effects of temperature on the operation of other types of semiconductor detector. In this paper, a summary of the data published in the literature on temperature effects in compensated (p-i-n) and non-compensated (p-n) detectors is presented. Conditions for optimum spectrometer performance and limits to operating temperature are discussed, from experimental results and theoretical considerations.
  • Keywords
    Detectors; Electron mobility; Germanium; Leakage current; Rivers; Silicon; Spectroscopy; Temperature dependence; Temperature distribution; Temperature sensors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1970.4325686
  • Filename
    4325686