DocumentCode :
795965
Title :
Gamma Ray Detectors Made from High Purity Germanium
Author :
Baertsch, R.D. ; Hall, R.N.
Author_Institution :
General Electric Research and Development Center Schenectady, New York
Volume :
17
Issue :
3
fYear :
1970
fDate :
6/1/1970 12:00:00 AM
Firstpage :
235
Lastpage :
240
Abstract :
A solution regrowth technique for growing P+ and N+ contacts on high purity germanium is described. Copper contamination of the high purity germanium is minimized by using KCN to remove copper from the surface of the germanium and by the gettering ability of molten indium in contact with the germanium. Diodes with leakage currents as low as 3 × 10-11 amp for 2000 volts applied to a fully depleted 4 mm thick detector have been fabricated. Preliminary measurements show that the resolution obtained with these diodes is comparable to the best Li drifted germanium detectors at 60 keV and 122 keV. Diodes have been warmed to room temperature as many as five times with no degradation in resolution.
Keywords :
Copper; Diodes; Gamma ray detectors; Germanium; Gettering; Indium; Leak detection; Leakage current; Pollution measurement; Surface contamination;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1970.4325695
Filename :
4325695
Link To Document :
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