Title :
Partial discharge diagnosis using statistical optimization on a PC-based system
Author :
Kranz, Hans-Gerd ; Krump, Reiner
Author_Institution :
Bergische Univ., Wuppertal, Germany
fDate :
2/1/1992 12:00:00 AM
Abstract :
Personal computer (PC)-aided partial discharge (PD) evaluation needs high-speed electronic devices for on-line measurement and digital conversion of PD signals. The authors include quantities to be measured to evaluate PD signals, which are characterized by a statistical scatter of magnitude and duration and are additionally influenced by noise and a complex time behavior. Using the correct algorithms and parameters, the PC gains some intelligence to discriminate unknown defects. Artificial sample defects, representing sources of PD, have been implanted into a GIS system. By performing a statistical analysis of charge, energy and phase angle on the measured signals, it is possible to solve the diagnosis problem by a noise resistant software solution. The final diagnosis is carried out by pattern recognition, using a specially calculated identification data set, which is compared to reference patterns measured earlier. The strategy takes into account the fundamental differences in the physics of discernible defects
Keywords :
charge measurement; computerised instrumentation; computerised pattern recognition; fault location; insulation testing; microcomputer applications; partial discharges; statistical analysis; switchgear testing; GIS system; PC-based system; artificial sample defects; defect discrimination; digital conversion; high-speed electronic devices; identification data set; noise resistant software solution; partial discharge diagnosis; pattern recognition; phase angle; signal charge; signal energy; statistical analysis; statistical optimization; Artificial intelligence; Geographic Information Systems; High-speed electronics; Microcomputers; Noise measurement; Partial discharge measurement; Partial discharges; Performance evaluation; Scattering; Time measurement;
Journal_Title :
Electrical Insulation, IEEE Transactions on