• DocumentCode
    795972
  • Title

    Integrating region growing and edge detection

  • Author

    Pavlidis, Theo ; Liow, Yuh-Tay

  • Author_Institution
    State Univ. of New York, Stony Brook, NY, USA
  • Volume
    12
  • Issue
    3
  • fYear
    1990
  • fDate
    3/1/1990 12:00:00 AM
  • Firstpage
    225
  • Lastpage
    233
  • Abstract
    A method that combines region growing and edge detection for image segmentation is presented. The authors start with a split-and merge algorithm wherein the parameters have been set up so that an over-segmented image results. Region boundaries are then eliminated or modified on the basis of criteria that integrate contrast with boundary smoothness, variation of the image gradient along the boundary, and a criterion that penalizes for the presence of artifacts reflecting the data structure used during segmentation (quadtree in this case). The algorithms were implemented in the C language on a Sun 3/160 workstation running under the Unix operating system. Simple tool images and aerial photographs were used to test the algorithms. The impression of human observers is that the method is very successful on the tool images and less so on the aerial photograph images. It is thought that the success in the tool images is because the objects shown occupy areas of many pixels, making it is easy to select parameters to separate signal information from noise
  • Keywords
    pattern recognition; picture processing; C language; Sun 3/160 workstation; Unix operating system; aerial photographs; boundary smoothness; data structure; edge detection; image gradient variation; image segmentation; pattern recognition; quadtree; region boundaries; region growing; split-and merge algorithm; tool images; Brightness; Computer science; Computer vision; Digital images; Helium; Image edge detection; Image segmentation; Laboratories; Pattern recognition; Tree data structures;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.49050
  • Filename
    49050