Title :
Divergence and linear classifiers for feature selection
Author :
Cardillo, G. ; King-Sun Fu
Author_Institution :
General Research Corporation, Santa Barbara, CA, USA
fDate :
12/1/1967 12:00:00 AM
Keywords :
Feature extraction; Pattern classification; Covariance matrix; Delay effects; Equations; Gaussian distribution; Optimal control; Pattern recognition; Probability distribution; Testing;
Journal_Title :
Automatic Control, IEEE Transactions on
DOI :
10.1109/TAC.1967.1098765