• DocumentCode
    796093
  • Title

    A Television System for the Direct Analysis of X-Ray Diffraction Patterns

  • Author

    Arndt, U.W. ; Gilmore, D.J.

  • Author_Institution
    MRC Laboratory of Molecular Biology Cambridge, England
  • Volume
    17
  • Issue
    3
  • fYear
    1970
  • fDate
    6/1/1970 12:00:00 AM
  • Firstpage
    318
  • Lastpage
    322
  • Abstract
    Further progress has been made with a direct recording system of X-ray diffraction patterns from single crystals. In this system the pattern is formed on a phosphor screen and viewed by a T.V. camera tube whose video output is digitised and presented to a computer. Earlier work had shown that with a sufficiently high degree of light amplification between the phosphor and and the T.V. camera, individual 8keV quantum scintillations could be detected and moderately weak patterns could be displayed on a T.V. monitor. However, for quantitative work on weak patterns the limit is set by the quantum noise due to the low X-ray flux; consequently, in the present system the camera tube, which is now an Image Isocon, is operated in an integrating mode. After each ´exposure´, during which the reading beam is switched off, the integrated charge pattern on the target of the Isocon is read out in a strobing fashion: the target is scanned at normal speeds but the beam is switched on only at those points where diffraction spots are known to be situated. The charge image of a diffraction spot is neutralised when the spot has been scanned, i.e. the read-out from the camera is destructive. It has been found that, owing to slight crystal misorientation and to aberrations in the light-and electron-optical systems, the positions of the diffraction spots can only be predicted approximately from the lattice spacings and initial orientation of the crystal: a computer-controlled search for the spots is, therefore, necessary.
  • Keywords
    Cameras; Computerized monitoring; Crystals; Pattern analysis; Phosphors; Solid scintillation detectors; TV; Video recording; X-ray diffraction; X-ray imaging;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1970.4325706
  • Filename
    4325706