Title :
Accuracy control in the optimization of microwave devices by finite-element methods
Author :
Gavrilovic, Minya M. ; Webb, Jon P.
Author_Institution :
EMS Technol., Ste. Anne De Bellevue, Que., Canada
fDate :
8/1/2002 12:00:00 AM
Abstract :
Automatically optimizing the design of a microwave device can be prohibitively time-consuming when a numerical electromagnetic-field analysis is necessary at each iteration. However, the time taken for the field analysis depends on the accuracy required, and in the early stage of the optimization relatively inaccurate solutions are adequate. This idea is exploited in a scheme that combines a quasi-Newton constrained optimizer with a two-dimensional p-adaptive finite-element method for finding scattering parameters. The scheme has been tested on three H-plane rectangular waveguide devices: a T-junction, a miter bend with a dielectric column, and a two-cavity iris-coupled filter. Time savings of more than an order of magnitude were obtained, compared to the standard approach of requiring equally high accuracy throughout the optimization.
Keywords :
S-parameters; computational complexity; electromagnetic wave scattering; electronic design automation; finite element analysis; gradient methods; microwave devices; quadratic programming; rectangular waveguides; waveguide filters; waveguide junctions; waveguide theory; H-plane rectangular waveguide devices; MATLAB toolbox; T-junction; accuracy control; computational cost; cost function; design automation; dielectric column; electromagnetic scattering; electromagnetic-field analysis; finite-element methods; gradient-based optimizer; microwave device optimization; miter bend; quasi-Newton constrained optimizer; scattering parameters; sequence of analyses; sequential quadratic programming; two-cavity iris-coupled filter; two-dimensional p-adaptive method; Automatic control; Constraint optimization; Design optimization; Electromagnetic analysis; Finite element methods; Microwave devices; Microwave theory and techniques; Optimization methods; Scattering parameters; Testing;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2002.801329