Title :
Simple bounds on serial signature analysis aliasing for random testing
Author :
Saxena, Nirmal R. ; Franco, Piero ; McCluskey, Edward J.
Author_Institution :
Stanford Univ., CA, USA
fDate :
5/1/1992 12:00:00 AM
Abstract :
It is shown that the aliasing probability is bounded above by (1+ε)/L≈1/L (ε small for large L ) for test lengths L less than the period, Lc, of the signature polynomial; for test lengths L that are multiples of Lc, the aliasing probability is bounded above by 1; for test lengths L greater than Lc and not a multiple of Lc, the aliasing probability is bounded above by 2/( Lc+1). These simple bounds avoid any exponential complexity associated with the exact computation of the aliasing probability. Simple bounds also apply to signature analysis based on any linear finite state machine (including linear cellular automaton). From these simple bounds it follows that the aliasing probability in a signature analysis design using β intermediate signatures is bounded by ((1+ε)βββ)/L β, for β<L and L/β<Lc. By using intermediate signatures the aliasing probability can be substantially reduced
Keywords :
computational complexity; finite automata; integrated circuit testing; logic testing; probability; aliasing probability; intermediate signatures; linear cellular automaton; linear finite state machine; random testing; serial signature analysis aliasing; signature polynomial; simple bounds; Analytical models; Automata; Automatic testing; Circuit faults; Circuit testing; Compaction; Linear code; Linear feedback shift registers; Polynomials; Very large scale integration;
Journal_Title :
Computers, IEEE Transactions on