Title :
Calculation of the soft error rate of submicron CMOS logic circuits
Author :
Juhnke, T. ; Klar, H.
Author_Institution :
Inst. of Microelectron., Tech. Univ. Berlin, Germany
fDate :
7/1/1995 12:00:00 AM
Abstract :
A method to calculate the soft error rate (SER) of CMOS logic circuits with dynamic pipeline registers is described. This method takes into account charge collection by drift and diffusion. The method is verified by comparison of calculated SER´s to measurement results. Using this method, the SER of a highly pipelined multiplier is calculated as a function of supply voltage for a 0.6 μm, 0.3 μm, and 0.12 μm technology, respectively. It has been found that the SER of such highly pipelined submicron CMOS circuits may become too high so that countermeasures have to be taken. Since the SER greatly increases with decreasing supply voltage, low-power/low-voltage circuits may show more than eight times the SER for half the normal supply voltage as compared to conventional designs
Keywords :
CMOS logic circuits; logic testing; multiplying circuits; pipeline arithmetic; 0.12 to 0.6 micron; SER; charge collection; dynamic pipeline registers; low-power/low-voltage circuits; soft error rate; submicron CMOS logic circuits; supply voltage; CMOS logic circuits; CMOS technology; Circuit simulation; Error analysis; Geometry; Logic circuits; MOS devices; Pipelines; Registers; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
