DocumentCode :
796657
Title :
Modeling of the Saturation Characteristics of High Voltage Transistors
Author :
Gwyn, C.W. ; Summers, G.G. ; Corbett, W.T.
Author_Institution :
Sandia Laboratories Albuquerque, New Mexico 87115
Volume :
17
Issue :
6
fYear :
1970
Firstpage :
63
Lastpage :
69
Abstract :
The conventional Ebers-Moll model does not provide an accurate representation of the saturation region characteristics for transistors with a high resistivity collector region. Accurate one-dimensional calculations of device characteristics indicate that the size of the effective collector resistance is modulated at high currents by the extension of the neutral base into the collector region. Based on this analysis, a non-linear collector resistance is added to the Ebers-Moll equivalent circuit model to provide a more accurate representation of the characteristics in the saturation region.
Keywords :
Adders; Atomic measurements; Circuit analysis; Conductivity; Current measurement; Electronic circuits; Equivalent circuits; Laboratories; Poisson equations; Voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1970.4325768
Filename :
4325768
Link To Document :
بازگشت