Title :
1-out-of-n dynamic CMOS checker
Author :
Metra, C. ; Favalli, M.
Author_Institution :
Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
fDate :
11/9/1995 12:00:00 AM
Abstract :
The authors propose an original 1/n dynamic checker (for any value of n) which is totally self-checking with respect to a wide set of realistic faults, including resistive bridgings. The proposed scheme combines high self-testing capability, low area overhead and the absence of static power consumption
Keywords :
CMOS logic circuits; automatic testing; built-in self test; design for testability; integrated circuit testing; logic testing; BIST; dynamic CMOS checker; low area overhead; resistive bridgings; self-testing capability; totally self-checking;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19951384
