• DocumentCode
    796672
  • Title

    1-out-of-n dynamic CMOS checker

  • Author

    Metra, C. ; Favalli, M.

  • Author_Institution
    Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
  • Volume
    31
  • Issue
    23
  • fYear
    1995
  • fDate
    11/9/1995 12:00:00 AM
  • Firstpage
    1999
  • Lastpage
    2000
  • Abstract
    The authors propose an original 1/n dynamic checker (for any value of n) which is totally self-checking with respect to a wide set of realistic faults, including resistive bridgings. The proposed scheme combines high self-testing capability, low area overhead and the absence of static power consumption
  • Keywords
    CMOS logic circuits; automatic testing; built-in self test; design for testability; integrated circuit testing; logic testing; BIST; dynamic CMOS checker; low area overhead; resistive bridgings; self-testing capability; totally self-checking;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19951384
  • Filename
    490599
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=796672