Title :
Component Vulnerability Analysis of Microcircuits
Author :
Raymond, James P.
Author_Institution :
Northrop Corporate Laboratories Hawthorne, California
Keywords :
Admittance; Application software; Circuits; Contracts; Degradation; Failure analysis; Ionizing radiation; Laboratories; Mathematical model; Semiconductor device measurement;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1970.4325772
