Title :
IGBT spice - An experimentally verified model with parameters extraction by device nondestructive measurements
Keywords :
Conductivity; Equivalent circuits; Insulated gate bipolar transistors; Niobium; Parameter extraction; Resistors; SPICE; Semiconductor device modeling; Video recording; Voltage;
Journal_Title :
Circuits and Devices Magazine, IEEE
DOI :
10.1109/MCD.2005.1578584
