DocumentCode
797109
Title
IGBT spice - An experimentally verified model with parameters extraction by device nondestructive measurements
Author
Yuan, S.C.
Volume
21
Issue
6
fYear
2006
Firstpage
21
Lastpage
27
Keywords
Conductivity; Equivalent circuits; Insulated gate bipolar transistors; Niobium; Parameter extraction; Resistors; SPICE; Semiconductor device modeling; Video recording; Voltage;
fLanguage
English
Journal_Title
Circuits and Devices Magazine, IEEE
Publisher
ieee
ISSN
8755-3996
Type
jour
DOI
10.1109/MCD.2005.1578584
Filename
1578584
Link To Document