DocumentCode :
797121
Title :
Electrical conduction and electroluminescence of vacuum-evaporated thin TCNQ films
Author :
Kojima, Kenzo ; Maeda, Akinori ; Ieda, Mirai
Author_Institution :
Dept. of Electr. Eng., Aichi Inst. of Technol., Toyota, Japan
Volume :
27
Issue :
3
fYear :
1992
fDate :
6/1/1992 12:00:00 AM
Firstpage :
629
Lastpage :
635
Abstract :
Electroluminescence (EL) and electrical conduction in TCNQ (tetracyanoquinodimethane) thin films prepared by the vacuum-evaporation technique were investigated. X-ray diffraction studies showed that the specimen prepared at 280°C was crystalline, while the one prepared at 180°C was amorphous. An infrared (IR) absorption analysis showed that the main chemical composition of TCNQ has been largely preserved in the vacuum-evaporated films. The polarized IR spectrum indicated that the aromatic ring of the evaporated TCNQ molecules is arranged nearly parallel to the substrate. The electrical properties depended strongly on the film deposition conditions, such as deposition rate and/or temperature and substrate temperature. The conduction currents were also affected by the electrode materials. Higher conductivity was observed in the specimen with a Cu anode than that with Au or Al. A weak EL which was well in proportion to the conduction current was observed in the high-field region of >105 V/cm. The thermally stimulated current showed two peaks at -120 and -20°C. The trap depths were estimated as 0.10 and 0.22 eV, respectively
Keywords :
charge transfer states; electroluminescence; electron traps; luminescence of organic solids; one-dimensional conductivity; organic compounds; thermally stimulated currents; vacuum deposited coatings; 180 C; 280 C; X-ray diffraction studies; amorphous; chemical composition; crystalline; deposition rate; deposition temperature; electrical conduction; electroluminescence; film deposition conditions; high-field region; polarized IR spectrum; substrate temperature; thermally stimulated current; thin TCNQ films; trap depths; vacuum-evaporated; Amorphous materials; Chemical analysis; Crystallization; Electroluminescence; Electroluminescent devices; Substrates; Temperature dependence; Transistors; Vacuum technology; X-ray diffraction;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/14.142728
Filename :
142728
Link To Document :
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