• DocumentCode
    797132
  • Title

    MOSFET hand analysis using BSIM

  • Author

    Brews, John R.

  • Author_Institution
    Arizona Univ., Tucson, AZ, USA
  • Volume
    21
  • Issue
    6
  • fYear
    2006
  • Firstpage
    28
  • Lastpage
    36
  • Abstract
    This article describes the set-up of the Liu small-signal circuit for hand analysis of circuits using MOSFETs with BSIM models, Liu´s circuit differs from standard textbook circuits in the use of a complex-valued transconductance and does not make the common, but inaccurate, simplification of neglecting the output drain-to-body capacitance. BSIM and Liu´s circuit agree completely for the frequency response of a common-source amplifier. This example shows that Liu´s complex transconductance is essential to find the correct corner frequency. The complex transconductance provides the same corner frequency regardless of the value selected for the BSIM parameter XPART, which is not true of a circuit with a real transconductance. The value selected for XPART affects somewhat the higher frequency pole of this amplifier, and affects radically the high frequency zero. As a result, uncertainty in the value of XPART translates directly into uncertainty in the high frequency response, and a corresponding uncertainty in design.
  • Keywords
    MOSFET; MOSFET circuits; amplifiers; network analysis; semiconductor device models; BSIM models; Berkeley short-channel insulated-gate field-effect transistor model; MOSFET hand analysis; XPART technology; circuit hand analysis; common-source amplifier; complex-valued transconductance; small-signal circuits; Analytical models; Circuit simulation; Debugging; Error analysis; FETs; MOS devices; MOSFET circuits; Resistors; SPICE; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Circuits and Devices Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    8755-3996
  • Type

    jour

  • DOI
    10.1109/MCD.2005.1578586
  • Filename
    1578586