DocumentCode :
797477
Title :
Pulsed Feedback Tecniques for Semicondctor Detector Radiation Spectrometers
Author :
Landis, D.A. ; Goulding, F.S. ; Pehl, R.H. ; Walto, J.T.
Author_Institution :
Lawrence Radiation Laboratory University of Califomia Berkeley, California
Volume :
18
Issue :
1
fYear :
1971
Firstpage :
115
Lastpage :
124
Abstract :
Methods of applying pulsed-charge feedback to the charge-sensitive preamplifiers used with semiconductor detectors are discussed. All have in commn the accumulation of radiation-induced charge pulses on a feedback capacitor to produce a voltage ramp at the output of the feedback stage, which is reset at an appropriate point by pulsing a charge feedback path. Advantages of pulsed feedback over the conventional dc feedback techniques are discussed, together with the precautions required to reduce the effect of the large reset pulse on the later electronics. The application of pulsed-light feedback to low energy X-ray spectrometers is discussed and results are presented. We also discuss sane aspects of this system that tend to limit its high-rate performance. A brief account of the use of a transistor current-switch feedback system to reduce overload problems in high-energy ??-ray spectrometers is also given.
Keywords :
FETs; Feedback; Leakage current; Photodiodes; Preamplifiers; Radiation detectors; Resistors; Semiconductor device noise; Spectroscopy; Voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1971.4325851
Filename :
4325851
Link To Document :
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