Noise performance at cryogenic temperatures at AlGaAs/InGaAs HEMT´s with 0.15-μm T-shaped WSix gates

T-shaped 0.15-μm WSi_x gate HEMTs have been fabricated on AlGaAs/InGaAs MBE wafers. Their S-parameters, output noise spectral density P_no, and noise temperatures T _e at cryogenic temperatures, were measured. The current gain cutoff frequency f_T increases from 61 GHz at 295 K to 87 GHz at 90 K. P_no and T_e measurements indicate that the hot-electron effect is noticeable at low temperatures at high drain current. At 30 GHz, the noise temperature is 19±3 K with an associated gain of 10.4 dB at the physical temperature of 20 K. The results demonstrate the great potential of AlGaAs/InGaAs HEMTs for low-temperature applications