DocumentCode :
79772
Title :
High-Performance Split-Gate Enhanced UMOSFET With p-Pillar Structure
Author :
Ying Wang ; Hai-Fan Hu ; Cheng-Hao Yu ; Hao Lan
Author_Institution :
Coll. of Inf. & Commun. Eng., Harbin Eng. Univ., Harbin, China
Volume :
60
Issue :
7
fYear :
2013
fDate :
Jul-13
Firstpage :
2302
Lastpage :
2307
Abstract :
In this paper, a split-gate resurf stepped oxide (RSO) vertical UMOSFET with p-pillar under the p+ plug region structure is proposed. The p-pillar could modulate the electric field of the drift region with the split-gate in 3-D and simultaneously brings electric field peaks at the sidewall junction between p-pillar and n-drift region. Thus the split-gate enhanced with p-pillar (SGEP) UMOS could increase the drift region doping concentration, reduce the on-state-specific resistance, and maintains the breakdown voltage as compared with the super junction and split-gate RSO UMOSs. Numerical simulation results show that the charge imbalance endurance of SGEP is also largely increased.
Keywords :
MOSFET; numerical analysis; semiconductor device models; semiconductor doping; RSO vertical UMOSFET; SGEP UMOS; breakdown voltage; charge imbalance endurance; drift region doping concentration; electric field; high-performance split-gate enhanced UMOSFET; n-drift region; numerical simulation; on-state-specific resistance; p-pillar structure; p+ plug region structure; sidewall junction; split-gate enhanced with p-pillar UMOS; split-gate resurf stepped oxide vertical UMOSFET; superjunction RSO UMOS; Breakdown voltage (BV); on-state specific resistance (RSP); split-gate; trench gate UMOSFET;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2013.2260547
Filename :
6521339
Link To Document :
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