Title :
Correlation-Preserved Statistical Timing With a Quadratic Form of Gaussian Variables
Author :
Zhang, Lizheng ; Chen, Weijen ; Hu, Yuhen ; Gubner, John A. ; Chen, Charlie Chung-Ping
Author_Institution :
Cadence Design Syst., San Jose, CA
Abstract :
A recent study shows that the existing first-order canonical timing model is not sufficient to represent the dependency of the gate/wire delay on the processing and operational variations when these variations become more and more significant. Due to nonlinear mapping from variation sources to the gate/wire delay, the distribution of the delay will no longer be Gaussian even if variation sources are normally distributed. A novel "quadratic timing model" is proposed to capture the nonlinearity of the dependency of gate/wire delays and arrival times on the variation sources. Systematic methodology is also developed to evaluate the correlation and distribution of the quadratic timing model. Based on these, a statistical static timing analysis algorithm that retains the complete correlation information during timing analysis and has linear computation complexity with respect to both the circuit size and the number of variation sources is proposed. Tested on the ISCAS circuits, the proposed algorithm shows significant accuracy improvement over the existing first-order algorithm with a small amount of computational cost
Keywords :
Gaussian distribution; integrated circuit design; integrated circuit interconnections; quadratic programming; statistical analysis; Gaussian variables; canonical timing model; complete correlation information; correlation-preservation; gate/wire delay; linear computation complexity; nonlinear mapping; quadratic form; quadratic timing model; statistical timing; timing analysis; Algorithm design and analysis; Circuit analysis computing; Circuit testing; Computational efficiency; Delay; Helium; Information analysis; Random variables; Timing; Wire; Correlation; quadratic timing model; statistical timing analysis;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2006.873885