DocumentCode :
797900
Title :
A time-domain approach to simulation and characterization of RF HBT two-tone intermodulation distortion
Author :
Huang, Kuen Yu ; Li, Yiming ; Lee, Chien-Ping
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Taiwan, Taiwan
Volume :
51
Issue :
10
fYear :
2003
Firstpage :
2055
Lastpage :
2062
Abstract :
In this paper, we evaluate the two-tone intermodulation distortion for heterojunction bipolar transistors (HBTs) operated at RF. We directly solve the nonlinear differential equations of the HBT large-signal model in time domain by employing the waveform-relaxation and monotone-iterative methods. Based on time-domain results, sinusoidal waveform outputs are transformed into the frequency domain with the fast Fourier transform. Furthermore, the output third-order intercept-point values of the HBT are computed with the spectra. Results for a fabricated InGaP HBT under different testing conditions are reported and compared among the HSPICE results, the results with harmonic balance methodology, and the measured data. Comparisons among these results show that our method demonstrates its superiority over the conventional approaches. This characterization alternative has allowed us to study RF device properties, perform thermal consumption and sensitivity analysis, and extract model parameters.
Keywords :
UHF bipolar transistors; fast Fourier transforms; heterojunction bipolar transistors; intermodulation distortion; iterative methods; semiconductor device models; sensitivity analysis; time-domain analysis; RF HBT; fast Fourier transform; frequency domain; harmonic balance methodology; heterojunction bipolar transistors; model parameters; monotone-iterative methods; nonlinear differential equations; output third-order intercept-point values; sensitivity analysis; sinusoidal waveform outputs; testing conditions; thermal consumption analysis; time-domain approach; two-tone intermodulation distortion; waveform-relaxation methods; Data mining; Differential equations; Fast Fourier transforms; Frequency domain analysis; Heterojunction bipolar transistors; Intermodulation distortion; Radio frequency; Sensitivity analysis; Testing; Time domain analysis;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2003.817681
Filename :
1234745
Link To Document :
بازگشت