Title :
IEEE Standard 1500 Compatible Interconnect Diagnosis for Delay and Crosstalk Faults
Author :
Li, Katherine Shu-Min ; Su, Chauchin ; Chang, Yao-Wen ; Lee, Chung-Len ; Chen, Jwu E.
Author_Institution :
Dept. of Comput. Sci. & Eng., Nat. Sun Yat-Sen Univ., Kaohsiung
Abstract :
An interconnect diagnosis scheme based on the oscillation ring (OR) test methodology for systems-on-chip (SOC) design with heterogeneous cores is proposed. In addition to traditional stuck-at and open faults, the OR test can also detect and diagnose important interconnect faults such as delay faults and crosstalk glitches. The large number of test rings in the SOC design, however, significantly complicates the interconnect diagnosis problem. In this paper, the diagnosability of an interconnect structure is first analyzed then a fast diagnosability checking algorithm and an efficient diagnosis ring generation algorithm are proposed. It is shown in this paper that the generation algorithm achieves the maximum diagnosability for any interconnect. Two optimization techniques are also proposed, an adaptive and a concurrent diagnosis method, to improve the efficiency and effectiveness of interconnect diagnosis. Experiments on the MCNC benchmark circuits show the effectiveness of the proposed diagnosis algorithms. In all experiments, the method achieves 100% fault detection coverage and the optimal interconnect diagnosis resolution
Keywords :
IEEE standards; crosstalk; fault simulation; integrated circuit design; integrated circuit interconnections; system-on-chip; IEEE standard 1500; adaptive diagnosis method; compatible interconnect diagnosis; concurrent diagnosis method; crosstalk faults; delay faults; fault detection; fault diagnosis; integrated circuit interconnections; interconnect structure; oscillation ring; ring generation algorithm; systems-on-chip design; Algorithm design and analysis; Circuit faults; Crosstalk; Delay; Electrical fault detection; Fault detection; Fault diagnosis; Integrated circuit interconnections; Optimization methods; System testing; Crosstalk fault; delay fault; fault diagnosis; interconnections; oscillation ring (OR) test scheme;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2006.881330