Title :
On image analysis by the methods of moments
Author :
Teh, Cho-Huak ; Chin, Roland T.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
fDate :
7/1/1988 12:00:00 AM
Abstract :
Various types of moments have been used to recognize image patterns in a number of applications. A number of moments are evaluated and some fundamental questions are addressed, such as image-representation ability, noise sensitivity, and information redundancy. Moments considered include regular moments, Legendre moments, Zernike moments, pseudo-Zernike moments, rotational moments, and complex moments. Properties of these moments are examined in detail and the interrelationships among them are discussed. Both theoretical and experimental results are presented
Keywords :
pattern recognition; picture processing; Legendre moments; Zernike moments; complex moments; image analysis; image-representation; information redundancy; noise sensitivity; pattern recognition; picture processing; regular moments; rotational moments; Image analysis; Image recognition; Image reconstruction; Image representation; Image sampling; Moment methods; Pattern analysis; Pattern recognition; Polynomials; Stochastic resonance;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
