Title :
Statistical analysis of analog structures through variance calculation
Author :
Graupner, Achim ; Schwarz, Wolfgang ; Schuffny, Rene
Author_Institution :
Dept. of Electr. Eng. & Inf. Technol., Technische Univ. Dresden, Germany
fDate :
8/1/2002 12:00:00 AM
Abstract :
Variance analysis is used for the estimation of how random device parameter variation effects the behavior of analog integrated circuits. This method is very effective if the random parameter deviations can be assumed to be normally distributed and statistically independent and if the nonlinear dependence of the circuit characteristics can be linearized around the nominal (mean) parameter values. It is shown under which conditions the nonlinear dependencies of the system characteristics on the parameters have to be taken into account and how this can improve the accuracy of statistical analysis. This is illustrated with two examples: a transconductance amplifier and an analog filter.
Keywords :
analogue integrated circuits; normal distribution; statistical analysis; analog filter; analog integrated circuit; nonlinear dependence; normal distribution; random parameter; statistical analysis; transconductance amplifier; variance; Analog integrated circuits; Analysis of variance; Circuit optimization; Computational modeling; Filters; Linear approximation; Monte Carlo methods; Performance analysis; Statistical analysis; Transconductance;
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
DOI :
10.1109/TCSI.2002.801260