Title :
Evaluation Method for Magnetooptical Disk System Based on Jitter Measurement
Author :
Tanaka, S. ; Fukamachi, Y.
Author_Institution :
Matsushita Electric Industrial Co., Ltd.
Keywords :
Apertures; Frequency measurement; Jitter; Lenses; Magnetooptic effects; Magnetooptic recording; Noise measurement; Optical modulation; Optical polarization; Signal detection;
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
DOI :
10.1109/TJMJ.1991.4565236
