DocumentCode :
798720
Title :
Measurement of Reflection Anisotropy of Polarized Light for Detecting Surface Perpendicular Orientation in MP-LIPS Tape
Author :
Satoh, Y. ; Shikama, S. ; Soutome, Y. ; Ohtsubo, A.
Author_Institution :
Yamagata University.
Volume :
6
Issue :
9
fYear :
1991
Firstpage :
744
Lastpage :
751
Abstract :
A rapid, non-destructive optical method for detecting the perpendicular orientation at the surface of metal LIPS tape is described. This technique uses reflection anisotropy due to the depolarization coefficient anisotropy of the acicular metal particles. A tape sample with low anisotropy according to this method of evaluation exhibited higher density wavelength response characteristics.
Keywords :
Anisotropic magnetoresistance; Contacts; Face detection; Geometrical optics; Lips; Magnetic heads; Optical films; Optical polarization; Optical reflection; Optical surface waves;
fLanguage :
English
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
Publisher :
ieee
ISSN :
0882-4959
Type :
jour
DOI :
10.1109/TJMJ.1991.4565245
Filename :
4565245
Link To Document :
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