• DocumentCode
    798784
  • Title

    Reliability concerns in embedded system designs

  • Author

    Narayanan, Vijaykrishnan ; Xie, Yuan

  • Author_Institution
    Comput. Sci. Eng. Dept., Pennsylvania State Univ., University Park, PA, USA
  • Volume
    39
  • Issue
    1
  • fYear
    2006
  • Firstpage
    118
  • Lastpage
    120
  • Abstract
    Embedded computing systems have become a pervasive part of daily life, used for tasks ranging from providing entertainment to assisting the functioning of key human organs. As technology scales, designing a dependable embedded system atop a less reliable hardware platform poses great challenges for designers. Cost and energy sensitivity, as well as real-time constraints, make some fault-tolerant techniques unviable for embedded system design. Many techniques to improve reliability can incur performance, energy, or cost penalties. Further, some solutions targeted at a specific failure mechanism could negatively affect other mechanisms. For example, lowering operational voltage can help mitigate thermal problems but increases vulnerability to soft errors. Developers must understand the trade offs when designing reliable embedded systems.
  • Keywords
    embedded systems; fault tolerant computing; embedded system design; fault-tolerant technique; reliability; Circuit noise; Dynamic voltage scaling; Embedded system; Integrated circuit interconnections; Latches; Noise generators; Power supplies; Power system interconnection; Power system reliability; Timing; embedded systems; eystem design;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/MC.2006.31
  • Filename
    1580398