DocumentCode
798784
Title
Reliability concerns in embedded system designs
Author
Narayanan, Vijaykrishnan ; Xie, Yuan
Author_Institution
Comput. Sci. Eng. Dept., Pennsylvania State Univ., University Park, PA, USA
Volume
39
Issue
1
fYear
2006
Firstpage
118
Lastpage
120
Abstract
Embedded computing systems have become a pervasive part of daily life, used for tasks ranging from providing entertainment to assisting the functioning of key human organs. As technology scales, designing a dependable embedded system atop a less reliable hardware platform poses great challenges for designers. Cost and energy sensitivity, as well as real-time constraints, make some fault-tolerant techniques unviable for embedded system design. Many techniques to improve reliability can incur performance, energy, or cost penalties. Further, some solutions targeted at a specific failure mechanism could negatively affect other mechanisms. For example, lowering operational voltage can help mitigate thermal problems but increases vulnerability to soft errors. Developers must understand the trade offs when designing reliable embedded systems.
Keywords
embedded systems; fault tolerant computing; embedded system design; fault-tolerant technique; reliability; Circuit noise; Dynamic voltage scaling; Embedded system; Integrated circuit interconnections; Latches; Noise generators; Power supplies; Power system interconnection; Power system reliability; Timing; embedded systems; eystem design;
fLanguage
English
Journal_Title
Computer
Publisher
ieee
ISSN
0018-9162
Type
jour
DOI
10.1109/MC.2006.31
Filename
1580398
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