Title :
Automatic pattern recognition: a study of the probability of error
Author_Institution :
Sch. of Comput. Sci., McGill Univ., Montreal, Que., Canada
fDate :
7/1/1988 12:00:00 AM
Abstract :
A test sequence is used to select the best rule from a class of discrimination rules defined in terms of the training sequence. The Vapnik-Chervonenkis and related inequalities are used to obtain distribution-free bounds on the difference between the probability of error of the selected rule and the probability of error of the best rule in the given class. The bounds are used to prove the consistency and asymptotic optimality for several popular classes, including linear discriminators, nearest-neighbor rules, kernel-based rules, histogram rules, binary tree classifiers, and Fourier series classifiers. In particular, the method can be used to choose the smoothing parameter in kernel-based rules, to choose k in the k-nearest neighbor rule, and to choose between parametric and nonparametric rules
Keywords :
artificial intelligence; computerised pattern recognition; error statistics; probability; Fourier series classifiers; artificial intelligence; automatic pattern recognition; binary tree classifiers; error statistics; histogram rules; kernel-based rules; linear discriminators; nearest-neighbor rules; probability; training sequence; Binary trees; Classification tree analysis; Error analysis; Fourier series; Histograms; Nearest neighbor searches; Pattern recognition; Probability; Smoothing methods; Testing;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on