DocumentCode :
798998
Title :
The offset voltage of heterojunction bipolar transistors using two-dimensional numerical simulation with current boundary condition
Author :
Liou, L.L. ; Ebel, J. ; Huang, C.I.
Author_Institution :
Wright Lab., Wright-Patterson AFB, OH, USA
Volume :
39
Issue :
3
fYear :
1992
fDate :
3/1/1992 12:00:00 AM
Firstpage :
742
Lastpage :
745
Abstract :
The offset voltage of an emitter-mesa AlGaAs-GaAs heterojunction bipolar transistor was obtained from the transistor´s current-voltage characteristics calculated using a two-dimensional numerical simulation with a current boundary condition at the base contact. The results show that the offset voltage strongly depends on the position of the emitter-base p-n junction and on the width of the emitter mesa
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; simulation; AlGaAs-GaAs; HBT; base contact; current boundary condition; current-voltage characteristics; emitter mesa width; emitter-base p-n junction; heterojunction bipolar transistors; junction position; offset voltage; two-dimensional numerical simulation; Boundary conditions; Charge carrier processes; Circuit simulation; Current density; Equivalent circuits; Gallium arsenide; Heterojunction bipolar transistors; Numerical simulation; P-n junctions; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.123506
Filename :
123506
Link To Document :
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