• DocumentCode
    7993
  • Title

    Development of a Chemically Nonequilibrium Model on Decaying SF _{6} Arc Plasmas

  • Author

    Tanaka, Yuichi ; Suzuki, Kenji

  • Author_Institution
    Fac. of Electr. & Comput. Eng., Kanazawa Univ., Kanazawa, Japan
  • Volume
    28
  • Issue
    4
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    2623
  • Lastpage
    2629
  • Abstract
    This paper describes the development of a 2-D thermofluid model with consideration of chemically nonequilibrium effects self-consistently on an SF6 arc plasma in decaying phase. The SF6 arc plasma in decaying phase can be seen in a high-voltage SF6 gas circuit breaker (CB) during a large current interruption process. The developed model here does not assume chemical equilibrium condition in the arc plasma, although the conventional numerical model often assumes the local thermodynamic equilibrium. This developed model accounts for 19 species, including molecules, atoms, monatomic ions, polyatomic ions, and the electrons. It also takes a total of 122 reactions into account, including dissociation, ionization, and other chemical reactions in SF6 plasmas. We successfully calculated transient distribution of the temperature and chemical reaction fields for SF6 arc plasma under a free recovery state for a fundamental study.
  • Keywords
    arcs (electric); dissociation; gas blast circuit breakers; ionisation; sulphur compounds; transients; 2D thermofluid model; SF6; chemical reactions; chemically nonequilibrium effect; chemically nonequilibrium model; decaying arc plasmas; dissociation; high voltage gas circuit breaker; ionization; large current interruption process; monatomic ions; polyatomic ions; thermodynamic equilibrium; transient distribution; Arc discharges; Circuit breakers; Numerical models; Sulfur hexafluoride; Temperature distribution; Transient analysis; SF $_{6}$ arc; arc interruption; gas circuit breaker;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/TPWRD.2013.2264549
  • Filename
    6545389