DocumentCode :
799537
Title :
Reversed Temperature-Dependent Propagation Delay Characteristics in Nanometer CMOS Circuits
Author :
Kumar, Ranjith ; Kursun, Volkan
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI
Volume :
53
Issue :
10
fYear :
2006
Firstpage :
1078
Lastpage :
1082
Abstract :
The supply voltage to threshold voltage ratio is reduced with each new technology generation. The gate overdrive variation with temperature plays an increasingly important role in determining the speed characteristics of CMOS integrated circuits. The temperature-dependent propagation delay characteristics, as shown in this brief, will experience a complete reversal in the near future. Contrary to the older technology generations, the speed of circuits in a 45-nm CMOS technology is enhanced when the temperature is increased at the nominal supply voltage. Operating an integrated circuit at the prescribed nominal supply voltage is not preferable for reliable operation under temperature fluctuations. A design methodology based on optimizing the supply voltage for temperature-variation-insensitive circuit performance is proposed in this brief. The optimum supply voltage is 45% to 53% lower than the nominal supply voltage in a 180-nm CMOS technology. Alternatively, the optimum supply voltage is 15% to 35% higher than the nominal supply voltage in a 45-nm CMOS technology. The speed and energy tradeoffs in the supply voltage optimization technique are also presented
Keywords :
CMOS integrated circuits; circuit optimisation; delays; integrated circuit design; nanoelectronics; 180 nm; 45 nm; high temperature speed; nanometer CMOS circuits; propagation delay characteristics; reversed temperature dependent; supply voltage scaling; temperature fluctuations; temperature variations; CMOS integrated circuits; CMOS technology; Design methodology; Design optimization; Fluctuations; Integrated circuit reliability; Integrated circuit technology; Propagation delay; Temperature; Threshold voltage; High temperature speed; supply voltage scaling; temperature variations;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2006.882218
Filename :
1715581
Link To Document :
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