• DocumentCode
    800266
  • Title

    Coupling between microstrip lines with finite width ground plane embedded in thin-film circuits

  • Author

    Ponchak, George E. ; Dalton, Edan ; Tentzeris, Manos M. ; Papapolymerou, John

  • Author_Institution
    NASA Glenn Res. Center, Cleveland, OH, USA
  • Volume
    28
  • Issue
    2
  • fYear
    2005
  • fDate
    5/1/2005 12:00:00 AM
  • Firstpage
    320
  • Lastpage
    327
  • Abstract
    Three-dimensional (3-D) interconnects built upon multiple layers of polyimide are required for constructing 3-D circuits on CMOS (low resistivity) Si wafers, GaAs, and ceramic substrates. Thin-film microstrip lines (TFMS) with finite-width ground planes embedded in the polyimide are often used. However, the closely spaced TFMS fines are susceptible to high levels of coupling, which degrades the circuit performance. In this paper, finite-difference time domain (FDTD) analysis and experimental measurements are used to demonstrate that the ground planes must be connected by via holes to reduce coupling in both the forward and backward directions. Furthermore, it is shown that coupled microstrip lines establish a slotline type mode between the two ground planes and a dielectric waveguide type mode, and that the connected via holes recommended here eliminate these two modes.
  • Keywords
    III-V semiconductors; dielectric waveguides; finite difference time-domain analysis; gallium arsenide; integrated circuit interconnections; integrated circuit metallisation; integrated circuit packaging; joining processes; microstrip lines; thin film circuits; 3D interconnects; CMOS; GaAs; coupling; finite difference time domain analysis; finite width ground plane; multiple layers; polyimide; thin film circuits; thin film microstrip lines; Ceramics; Conductivity; Coupling circuits; Finite difference methods; Gallium arsenide; Integrated circuit interconnections; Microstrip; Polyimides; Thin film circuits; Time domain analysis; Coupling; crosstalk; finite-difference time domain (FDTD); microstrip;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2005.846933
  • Filename
    1427856