• DocumentCode
    800606
  • Title

    On the Exploitation of Narrow-Width Values for Improving Register File Reliability

  • Author

    Hu, Jie ; Wang, Shuai ; Ziavras, Sotirios G.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ
  • Volume
    17
  • Issue
    7
  • fYear
    2009
  • fDate
    7/1/2009 12:00:00 AM
  • Firstpage
    953
  • Lastpage
    963
  • Abstract
    Protecting the register value and its data buses is crucial to reliable computing in high-performance microprocessors due to the increasing susceptibility of CMOS circuitry to soft errors induced by high-energy particle strikes. Since the register file is in the critical path of the processor pipeline, any reliable design that increases either the pressure on the register file or the register file access latency is not desirable. In this paper, we propose to exploit narrow-width register values, which present the majority of the generated values, for making a duplicate of the value within the same data item; this in-register duplication (IRD) eliminates the requirement for additional copy registers. The data path pipeline is augmented to efficiently incorporate parity encoding and parity checking such that error recovery is seamlessly supported in IRD and the parity checking is overlapped with the execution stage to avoid increasing the critical path. A detailed architectural vulnerability factor (AVF) analysis shows that IRD significantly reduces the AVF from 8.4% in a conventional unprotected register file to 0.1% in an IRD register file. Our experimental evaluation using the SPEC CINT2000 benchmark suite also shows that IRD provides superior read-with-duplicate (RWD) and error detection/recovery rates under heavy error injection as compared to previous reliability schemes, while only incurring a small power overhead.
  • Keywords
    CMOS integrated circuits; error detection; integrated circuit reliability; microprocessor chips; CMOS circuitry; architectural vulnerability factor analysis; data buses; data path pipeline; error detection; error recovery; in-register duplication; microprocessor; narrow-width register values; parity checking; parity encoding; read-with-duplicate; register file reliability; In-register duplication (IRD); narrow-width value; register file; reliability; soft errors;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2009.2017441
  • Filename
    4907212