DocumentCode :
800810
Title :
Contact reflectivity effects on thin p-clad InGaAs single quantum-well lasers
Author :
Wu, C.H. ; Zory, P.S. ; Emanuel, M.A.
Author_Institution :
Dept. of Electr. Eng., Florida Univ., Gainesville, FL, USA
Volume :
6
Issue :
12
fYear :
1994
Firstpage :
1427
Lastpage :
1429
Abstract :
Thin p-clad InGaAs quantum-well (QW) lasers with either Au or Ni as the p-contact metal have been fabricated. Due to reduced contact reflectivity, the Ni contact lasers hare significantly higher threshold currents and lower slope efficiencies than the Au contact lasers. In addition, operating wavelength differences greater than 50 mn are observed for cavity lengths between 250 and 700 microns, with large wavelength jumps occurring at shorter and longer cavity lengths. The measured wavelength effects are explained by incorporating the optical mode loss difference between the two laser types into quantum-well laser theory.<>
Keywords :
III-V semiconductors; electrical contacts; gallium arsenide; indium compounds; quantum well lasers; reflectivity; semiconductor-metal boundaries; 250 to 700 micron; Au; Au contact lasers; InGaAs; Ni; Ni contact lasers; cavity lengths; contact reflectivity effects; operating wavelength differences; optical mode loss difference; p-contact metal; slope efficiencies; thin p-clad InGaAs single quantum-well lasers; threshold currents; wavelength jumps; Gold; Indium gallium arsenide; Laser modes; Laser theory; Loss measurement; Optical losses; Quantum well lasers; Reflectivity; Threshold current; Wavelength measurement;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.392222
Filename :
392222
Link To Document :
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