DocumentCode :
801193
Title :
Relationship of Exciting Current to Noise-after-Write of Thin Film Head
Author :
Miyamoto, N. ; Fukui, H. ; Ohtsu, T. ; Karakama, Y.
Author_Institution :
Hitachi Ltd.
Volume :
7
Issue :
10
fYear :
1992
Firstpage :
768
Lastpage :
772
Abstract :
The behavior of noise-after-write in thin film heads was studied. The probability of noise-after-write events was decreased by applying a constant amplitude current or a decay amplitude current to the head coil, after shutting off the recording current. A constant-amplitude current was more effective for decreasing noise-after-write than a decay amplitude current. Comparison of the noise pulse of an Ni-Fe head and of a Co-Ta-Zr amorphous head showed that the former had a wider pulse width than the latter.
Keywords :
Amorphous materials; Magnetic domain walls; Magnetic films; Magnetic heads; Magnetic noise; Magnetic properties; Magnetic recording; Noise level; Space vector pulse width modulation; Transistors;
fLanguage :
English
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
Publisher :
ieee
ISSN :
0882-4959
Type :
jour
DOI :
10.1109/TJMJ.1992.4565497
Filename :
4565497
Link To Document :
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