DocumentCode :
801432
Title :
A Fast Beam Quality Measuring Device
Author :
van Kampen, W.A. ; Liedorp, J.
Author_Institution :
Delft University of Technology Dept. of Electrical Engineering Delft - The Netherlands
Volume :
18
Issue :
3
fYear :
1971
fDate :
6/1/1971 12:00:00 AM
Firstpage :
923
Lastpage :
925
Abstract :
A device has been designed and built to obtain the four dimensional emittance of a particle beam. Two rotating discs with hole patterns scan the beam using the Nipkov principle. The emittance is determined from 10.000 beam samples, each of which is taken in 1 ms. Dependent on the chosen hole pattern a complete cycle of 10.000 samples takes 20-40 s. A small computer is used to control the experiment and to store the measurement data. Beam samples of 1 nA and up can be measured with 1% accuracy. The emittance of a particle beam can be described as a function in the four dimensional phase space: E(x,x´,y,y´), with E = dI/dV, where x and y are mutually perpendiculat and transverse to the beam direction z, I is the beam current, dV a volume element in phase space, and x´ = dx/dz, y´ = dy/dz. A much used representation of the emittance is given by E(x,x´) = ¿ Edydy´, E(y,y´) = ¿ Edxdx´. phase space phase space
Keywords :
Current measurement; Decoding; Extraterrestrial measurements; Goniometers; Particle beam measurements; Particle beams; Performance evaluation; Position measurement; Signal processing; Switches;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1971.4326232
Filename :
4326232
Link To Document :
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