• DocumentCode
    801432
  • Title

    A Fast Beam Quality Measuring Device

  • Author

    van Kampen, W.A. ; Liedorp, J.

  • Author_Institution
    Delft University of Technology Dept. of Electrical Engineering Delft - The Netherlands
  • Volume
    18
  • Issue
    3
  • fYear
    1971
  • fDate
    6/1/1971 12:00:00 AM
  • Firstpage
    923
  • Lastpage
    925
  • Abstract
    A device has been designed and built to obtain the four dimensional emittance of a particle beam. Two rotating discs with hole patterns scan the beam using the Nipkov principle. The emittance is determined from 10.000 beam samples, each of which is taken in 1 ms. Dependent on the chosen hole pattern a complete cycle of 10.000 samples takes 20-40 s. A small computer is used to control the experiment and to store the measurement data. Beam samples of 1 nA and up can be measured with 1% accuracy. The emittance of a particle beam can be described as a function in the four dimensional phase space: E(x,x´,y,y´), with E = dI/dV, where x and y are mutually perpendiculat and transverse to the beam direction z, I is the beam current, dV a volume element in phase space, and x´ = dx/dz, y´ = dy/dz. A much used representation of the emittance is given by E(x,x´) = ¿ Edydy´, E(y,y´) = ¿ Edxdx´. phase space phase space
  • Keywords
    Current measurement; Decoding; Extraterrestrial measurements; Goniometers; Particle beam measurements; Particle beams; Performance evaluation; Position measurement; Signal processing; Switches;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1971.4326232
  • Filename
    4326232