• DocumentCode
    801697
  • Title

    Experimental class-F power amplifier design using computationally efficient and accurate large-signal pHEMT model

  • Author

    Wren, Michael ; Brazil, Thomas J.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. Coll. Dublin, Ireland
  • Volume
    53
  • Issue
    5
  • fYear
    2005
  • fDate
    5/1/2005 12:00:00 AM
  • Firstpage
    1723
  • Lastpage
    1731
  • Abstract
    This paper presents an experimental high-efficiency class-F power amplifier (PA) design, which integrates Rhodes´s efficient low-pass matching network topology with the charge conservative, robust, and accurate WREN/COBRA nonlinear pseudomorphic high electron-mobility transistor (pHEMT) model for optimal drain efficiency. Large-signal model verification is undertaken where one-tone, load-pull, and wireless code-division multiple-access baseband time-domain tests are compared for simulated and experimental cases. Following a detailed theoretical analysis, a class-F matching network is proposed that suppresses the necessary load harmonics and delivers maximum drain efficiency. Utilizing the GaAs pHEMT model in computer-aided design, a microstrip matching network layout was generated and built at 2 GHz. The drain efficiency recorded for the first-pass effort was 70.5% with the use of no post-fabrication circuit tuning. Excellent agreement is also observed between the PAs simulated and measured performance, thus highlighting the advantages of an accurate device model in PA design.
  • Keywords
    circuit tuning; microwave power amplifiers; power HEMT; semiconductor device models; 2 GHz; 70.5 percent; GaAs pHEMT model; WREN/COBRA; circuit tuning; class-F power amplifier; computer-aided design; large-signal pHEMT model; load harmonics; low-pass matching network; microstrip matching network; model verification; optimal drain efficiency; pseudomorphic high electron-mobility transistor; Baseband; Computational modeling; High power amplifiers; Multiaccess communication; Network topology; PHEMTs; Power amplifiers; Robustness; Testing; Time domain analysis; Amplifier; class F; nonlinear modeling; pseudomorphic high electron-mobility transistor (pHEMT);
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2005.847108
  • Filename
    1427976