• DocumentCode
    801729
  • Title

    Transimpedance Amplifier for High Sensitivity Current Measurements on Nanodevices

  • Author

    Ferrari, Giorgio ; Gozzini, Fabio ; Molari, Alessandro ; Sampietro, Marco

  • Author_Institution
    Dipt. di Elettron. e In- formazione, Politec. di Milano, Milan
  • Volume
    44
  • Issue
    5
  • fYear
    2009
  • fDate
    5/1/2009 12:00:00 AM
  • Firstpage
    1609
  • Lastpage
    1616
  • Abstract
    The paper presents a very high sensitivity transimpedance amplifier in standard CMOS 0.35 mum technology suited for sensing current signals from molecular and nanodevices systems. The circuit, based on an integrator followed by a differentiator configuration, features i) a low-noise time-continuous feedback loop to cope with possible standing currents from the device under test as high as few tens of nA without limiting the signal dynamic range; ii) active current-reducers to implement very high value equivalent resistances of hundreds of GOmega with high linearity irrespective to the current direction and characterized by a shot noise current level (2qI) which is, for low standing current, few orders of magnitude smaller than a physical resistor of equal value and iii) nested-Miller compensation networks to ensure strong stability over a bandwidth of few MHz. Thanks to the ability to draw large standing currents, the circuit is suitable for a use in biological systems where physiological medium is co-present. The measured input equivalent noise of 4 fA/radic(Hz) at about 100 kHz, recorded when the input dc current is lower than 10 pA, allows the chip to be used, among others, in impedance spectroscopy measurements at the nanoscale with a capability of detecting capacitance variations in sub-attofarad range to cope with the challenges of single-chip instrumentation.
  • Keywords
    CMOS integrated circuits; amplifiers; capacitance; electric impedance; electric resistance; resistors; shot noise; CMOS technology; capacitance; current-reducers; differentiator configuration; equivalent resistances; impedance spectroscopy; input dc current; integrator; low-noise time-continuous feedback loop; nested-Miller compensation networks; resistor; sensing current signals; shot noise current level; single-chip instrumentation; CMOS technology; Capacitance measurement; Circuit testing; Current measurement; Feedback circuits; Impedance measurement; Nanobioscience; Noise measurement; Paper technology; Semiconductor device measurement; Active resistor; high sensitivity instrumentation; instrument-on-chip; transimpedance amplifier;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2009.2016998
  • Filename
    4907328