• DocumentCode
    802175
  • Title

    Closed-form transmission line model for radiated susceptibility in metallic enclosures

  • Author

    Spadacini, Giordano ; Pignari, Sergio A. ; Marliani, Filippo

  • Author_Institution
    Dept. of Electr. Eng., Politecnico di Milano, Milan, Italy
  • Volume
    47
  • Issue
    4
  • fYear
    2005
  • Firstpage
    701
  • Lastpage
    708
  • Abstract
    This work presents an approximate frequency domain mathematical model based on the transmission line (TL) theory for field-to-wire coupling in a rectangular metallic enclosure. The currents and voltages at the terminations of a TL induced by known electromagnetic (EM) field sources are expressed in closed form. Validity limits and applicability of the model are discussed by comparing the analytical TL-based predictions with the outputs of a full-wave numerical analysis of the overall structure using a three-dimensional finite integration technique. Deviations from the full-wave solution, due to the scattered field from the TL, have been identified, analyzed, and discussed. The proposed analytical model proves to be generally suited for accurate prediction of radiated susceptibility of single-ended interconnections in closed environments.
  • Keywords
    electromagnetic coupling; electromagnetic fields; electromagnetic shielding; integration; metals; transmission line theory; closed-form transmission line model; electromagnetic field sources; field-to-wire coupling; full-wave numerical analysis; radiated susceptibility; rectangular metallic enclosures; three-dimensional finite integration technique; Couplings; Electromagnetic fields; Electromagnetic radiation; Frequency domain analysis; Mathematical model; Numerical analysis; Predictive models; Transmission line theory; Transmission lines; Voltage; Field-to-wire coupling; metallic enclosures; radiated susceptibility; transmission lines (TLs), wire scatterers;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2005.857875
  • Filename
    1580739