DocumentCode
802259
Title
Application of MFM to Magnetic Recording: For D.C. Characterization
Author
Mukasa, K. ; Tatebe, K. ; Inagami, K. ; Iizuka, M.
Author_Institution
Hokkaido University.
Volume
8
Issue
3
fYear
1993
fDate
3/1/1993 12:00:00 AM
Firstpage
212
Lastpage
218
Abstract
The magnetic field profiles of ferrite and MIG heads, and of magnetic media, were imaged by magnetic force microscopy (MFM) using a scanning tunneling microscope (STM) and a beam deflection sensor. On the basis of the profiles obtained, we discuss the force acting on the tip of the MFM and the magnetic structure of the tip. The MFM is a very powerful tool for observing detailed magnetic structures with high resolution without special sample preparation. However, some problems, considered in our conclusion, remain to be overcome.
Keywords
Ferrites; Force sensors; Image sensors; Magnetic force microscopy; Magnetic forces; Magnetic heads; Magnetic recording; Magnetic sensors; Magnetic tunneling; Sensor phenomena and characterization;
fLanguage
English
Journal_Title
Magnetics in Japan, IEEE Translation Journal on
Publisher
ieee
ISSN
0882-4959
Type
jour
DOI
10.1109/TJMJ.1993.4565605
Filename
4565605
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