DocumentCode :
80232
Title :
High-Sensitivity and Fast-Response Graphene/Crystalline Silicon Schottky Junction-Based Near-IR Photodetectors
Author :
Peng Lv ; Xiujuan Zhang ; Xiwei Zhang ; Wei Deng ; Jiansheng Jie
Author_Institution :
Inst. of Functional Nano & Soft Mater., Soochow Univ., Suzhou, China
Volume :
34
Issue :
10
fYear :
2013
fDate :
Oct. 2013
Firstpage :
1337
Lastpage :
1339
Abstract :
Schottky junction near-infrared photodetectors were constructed by combing monolayer graphene (MLG) film and bulk silicon. Notably, the device could operate at zero external voltage bias because of the strong photovoltaic behavior of the MLG/Si Schottky junction, giving rise to high responsivity and detectivity of 29 mAW-1 and 3.9×1011 cmHz1/2W-1, respectively, at room temperature. Time response measurement revealed a high response speed of 100 μs, which allowed the device following a fast varied light with frequency up to 2100 Hz. In addition, the device showed great potential for low light detection with intensity at 10 K.
Keywords :
Schottky barriers; elemental semiconductors; graphene; photodetectors; silicon; Schottky junction near-IR photodetectors; frequency 2100 Hz; graphene/crystalline silicon; low light detection; monolayer graphene film; temperature 10 K; time 100 mus; Graphene; Junctions; Photoconductivity; Photodetectors; Silicon; Substrates; Temperature measurement; Graphene; Schottky junction; near-infrared (NIR); photodetectors; planar Si;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2013.2275169
Filename :
6578093
Link To Document :
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