Title :
Analysis of E-O polymer mode converter with bottom transverse poling electrodes
Author :
Hwang, Shug-June ; Yu, Hsin Her
Author_Institution :
Dept. of Electro-Opt. Eng., Nat. United Univ., Taiwan
Abstract :
The operation of integrated-optics electrooptic (EO) polymer modulators relies on the Pockel effect that is generated by applying an electric field to the optical waveguides. Birefringent behavior occurs because of the dipole realignment of the poled polymer film. In this paper, the static-field analysis of the electric field distribution for the mode converters with bottom transverse electrodes incorporating a buffer layer was done by using an efficient discrete Fourier transform domain technique. According to the numerical analysis results, the electric-field distribution in the guiding layer is the function of electrode geometric configuration. Two parameters, the electrode width and spacing, were considered for the optimum arrangements of the coplanar electrodes deposited on the polymer waveguide modulator. Also studied was the influence of the asymmetric electrode width of the coplanar electrodes on the sample surface.
Keywords :
Pockels effect; birefringence; dielectric polarisation; electric fields; electro-optical modulation; electrodes; integrated optics; optical polymers; optical waveguides; Pockel effect; asymmetric electrode width; birefringent behavior; bottom transverse poling electrodes; buffer layer; coplanar electrodes; dipole realignment; discrete Fourier transform domain technique; electric field; electric field distribution; electrode geometric configuration; integrated-optics electrooptic polymer modulators; mode converters; optical waveguides; optimum arrangements; poled polymer film; polymer waveguide modulator; sample surface; static-field analysis; Electrodes; Electrooptic effects; Electrooptic modulators; Electrooptical waveguides; Integrated optics; Optical buffering; Optical films; Optical modulation; Optical polymers; Optical waveguides;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2003.817709