Title :
Electrooptic modulation of silicon-on-insulator submicrometer-size waveguide devices
Author :
Barrios, C. Angulo ; Almeida, V.R. ; Panepucci, R. ; Lipson, M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
Abstract :
In this paper, we propose and analyze an electrically modulated silicon-on-insulator (SOI) submicrometer-size high-index-contrast waveguide. The geometry of the waveguide provides high lateral optical confinement and defines a lateral p-i-n diode. The electrooptic structure is electrically and optically modeled. The effect of the waveguide geometry on the device performance is studied. Our calculations indicate that this scheme can be used to implement submicrometer high-index-contrast waveguide active devices on SOI. As an example of application, a one-dimensional microcavity intensity modulator is predicted to exhibit a modulation depth as high as 80% by employing a dc power consumption as low as 14 μW.
Keywords :
electro-optical modulation; integrated optics; intensity modulation; micro-optics; optical communication equipment; optical waveguide theory; optical waveguides; semiconductor device models; silicon-on-insulator; 14 muW; DC power consumption; Si-SiO2; electrically modeled; electrically modulated silicon-on-insulator submicrometer-size high-index-contrast waveguide; electrooptic modulation; geometry; high lateral optical confinement; high-index-contrast waveguide; lateral p-i-n diode; modulation depth; one-dimensional microcavity intensity modulator; optically modeled; silicon-on-insulator submicrometer-size waveguide; submicrometer high-index-contrast waveguide active devices; waveguide geometry; Electrooptic devices; Electrooptic modulators; Electrooptical waveguides; Geometrical optics; Intensity modulation; Microcavities; Optical modulation; Optical waveguides; P-i-n diodes; Silicon on insulator technology;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2003.818167