Title :
A Scan-Testable 6000 Gate Array
Author :
Berendts, P.A.B.
Author_Institution :
Philips Elcoma, Nijmegen, the Netherlands.
Abstract :
In this paper hardware and software aspects of the AGA6000 are described. The AGA6000 is the first member of a new family of Philips gate arrays. It is a high-speed double-layer metal gate array in which special flip-flop rows are implemented. These flip-flop rows automatically insert a scan path in a gate array design. A scan-path test vector generation program guarantees a complete hardware testing of the devices with a 100-percent fault coverage for single stuck-at-one/stuck-at-zero faults. This gate array family was announced in [1].
Keywords :
Circuit faults; Circuit testing; Clocks; Flip-flops; Hardware; Integrated circuit testing; Logic testing; Manufacturing; Performance evaluation; Timing;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.1986.350903
