DocumentCode :
802654
Title :
Analysis of Component Failure Problee Using Partially Ordered Sets
Author :
Boicourt, G.P.
Author_Institution :
Los Alamos Scientific Laboratory, University of California Los Alamos, New Mexico
Volume :
18
Issue :
4
fYear :
1971
Firstpage :
247
Lastpage :
250
Abstract :
It is often desirable, due to expense in time and money, to find the cause of component failures directly from available operational data rather than to resort to controlled tests. Such a method for analyzing component failures cause by manufacturing processing problems is illustrated by an application to a group of early failures among Scyllac capacitors. The application of the method proves that the failures were predominantly caused by inadequate drying of the capacitor packs. The method involves the use of partially ordered sets and can be considered as an abstraction of multivariate regression. The advantages and disadvantages of the method with respect to multivariate regression are discussed.
Keywords :
Atomic measurements; Capacitors; Data analysis; Failure analysis; Inspection; Laboratories; Manufacturing processes; Multivariate regression; Performance evaluation; Testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1971.4326349
Filename :
4326349
Link To Document :
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