Title :
On error exponents of modulo lattice additive noise channels
Author :
Liu, Tie ; Moulin, Pierre ; Koetter, Ralf
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA
Abstract :
Modulo lattice additive noise (MLAN) channels appear in the analysis of structured binning codes for Costa´s dirty-paper channel and of nested lattice codes for the additive white Gaussian noise (AWGN) channel. In this paper, we derive a new lower bound on the error exponents of the MLAN channel. With a proper choice of the shaping lattice and the scaling parameter, the new lower bound coincides with the random-coding lower bound on the error exponents of the AWGN channel at the same signal-to-noise ratio (SNR) in the sphere-packing and straight-line regions. This result implies that, at least for rates close to channel capacity, 1) writing on dirty paper is as reliable as writing on clean paper; and 2) lattice encoding and decoding suffer no loss of error exponents relative to the optimal codes (with maximum-likelihood decoding) for the AWGN channel.
Keywords :
AWGN channels; channel capacity; channel coding; error analysis; exponential distribution; random codes; AWGN channel; Costa dirty-paper channel; MLAN channel; additive white Gaussian noise; channel capacity; error exponent; modulo lattice additive noise; nested lattice code; optimal code; random-coding; scaling parameter; sphere-packing; structured binning code; AWGN channels; Additive noise; Additive white noise; Channel capacity; Gaussian noise; Interference constraints; Lattices; Maximum likelihood decoding; Transmitters; Writing; Additive white Gaussian noise (AWGN) channel; Costa´s dirty-paper channel; error exponents; lattice decoding; modulo lattice additive noise (MLAN) channel; nested lattice codes;
Journal_Title :
Information Theory, IEEE Transactions on
DOI :
10.1109/TIT.2005.862077