DocumentCode
802701
Title
Polydimethylsioxane fluidic interconnects for microfluidic systems
Author
Li, Shifeng ; Chen, Shaochen
Author_Institution
Mech. Eng. Dept., Univ. of Texas, Austin, TX, USA
Volume
26
Issue
3
fYear
2003
Firstpage
242
Lastpage
247
Abstract
This paper presents novel polydimethylsioxane (PDMS) based interconnects for microfluidic systems with a low dead volume. Through-hole type and "┌" type PDMS interconnects have been designed, fabricated, and tested for glass and plastic capillary tubing. Oxygen reactive ion etching and epoxy bonding methods are employed to bond PDMS interconnects to different substrate materials including silicon, glass, polymer and other thin film materials. Leakage pressure, leakage rate, and pull-out force are characterized for these interconnects. For reusable PDMS interconnects, the maximum leakage pressure reaches 510 kPa (75 psi) and the maximum pull-out force is about 800 mN. For nonreusable PDMS interconnects, the maximum leakage pressure is found to be 683 kPa (100 psi) and the maximum pull-out force is 2 N. For both types of PDMS interconnects, the leakage rate test demonstrates that the leakage is not detectable at a working pressure of 137 kPa (20 psi).
Keywords
curing; integrated circuit bonding; integrated circuit interconnections; microfluidics; polymer films; sputter etching; 137 kPa; 510 kPa; 683 kPa; PDMS interconnects; epoxy bonding methods; glass capillary tubing; leakage pressure; leakage rate; low dead volume; microfluidic systems; oxygen reactive ion etching; plastic capillary tubing; polydimethylsioxane fluidic interconnects; pull-out force; substrate materials; thin film materials; working pressure; Bonding; Etching; Fluidic microsystems; Glass; Microfluidics; Oxygen; Plastics; Polymer films; Substrates; Testing;
fLanguage
English
Journal_Title
Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1521-3323
Type
jour
DOI
10.1109/TADVP.2003.817961
Filename
1236523
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