• DocumentCode
    802833
  • Title

    Analysis of Ti:LiNbO3 waveguides using secondary ion mass spectrometry and near field method

  • Author

    Caccavale, F. ; Gonella, F. ; Quaranta, A. ; Mansour, I.

  • Author_Institution
    Dipartimento di Fisica, Padova Univ., Italy
  • Volume
    31
  • Issue
    13
  • fYear
    1995
  • fDate
    6/22/1995 12:00:00 AM
  • Firstpage
    1054
  • Lastpage
    1056
  • Abstract
    Secondary ion mass spectrometry and the propagating-mode near-field method have been used to determine the Ti concentration and refractive index profiles, respectively, of Ti:LiNbO3 channel waveguides. The nonlinear relationship between index change and dopant concentration is determined
  • Keywords
    chemical variables measurement; lithium compounds; optical testing; optical waveguides; refractive index measurement; secondary ion mass spectroscopy; titanium; LiNbO3:Ti; Ti concentration; Ti:LiNbO3 waveguides; dopant concentration; index change; near field method; nonlinear relationship; propagating-mode near-field method; refractive index profiles; secondary ion mass spectrometry;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19950732
  • Filename
    392704
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=802833