Title :
Vibration analysis of piezoelectric materials by optical methods
Author :
Lin, Hsien-Yang ; Huang, Jin H. ; Ma, Chien-Ching
Author_Institution :
Dept. of Mech. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
This study provides two noncontact and realtime optical measurement methods to assess the displacement, natural frequencies, and mode shapes of a vibrating piezoelectric material. The methods are carried out using amplitude-fluctuation electronic speckle pattern interferometry (AF-ESPI) and laser Doppler vibrometer (LDV), which are full-field and point-wise displacement measurement, respectively. Because the fringe patterns measured by AF-ESPI appear as a clear picture at the natural frequency, both natural frequencies and mode shapes of the vibrating material can be successfully obtained. In the LDV system, a swept-sine excitation signal from the function generator to the beam can result in a corresponding peak in frequency response curve at natural frequencies. From the frequency response curve, the natural frequencies are thus acquired. Measured results by both methods are seen to be in good agreement with theoretical predictions by the Galerkin method and finite element method.
Keywords :
displacement measurement; electronic speckle pattern interferometry; finite element analysis; measurement by laser beam; piezoelectric materials; vibration measurement; Galerkin method; LDV; amplitude-fluctuation electronic speckle pattern interferometry; displacement; finite element method; frequency response curve; fringe patterns; mode shapes; natural frequencies; noncontact optical measurement; peak; point-wise displacement measurement; real time measurement; swept-sine excitation signal; vibrating piezoelectric material; vibration analysis; Adaptive optics; Displacement measurement; Frequency measurement; Frequency response; Laser modes; Optical interferometry; Piezoelectric materials; Shape measurement; Speckle; Vibration measurement;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2002.1026026